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1.
Microcantilevers for atomic force microscope data storage / by Benjamin W. Chui by Series: Microsystems ; v. 2
Material type: Text Text; Format: print ; Literary form: Not fiction
Language: English
Publication details: Boston, Mass : Kluwer Academic Publishers, 1999
Availability: Items available for loan: National Library of India (1)Call number: E502.82 C471.

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2.
Wafer-level testing and test during burn-in for integrated circuits / Sudarshan Bahukudumbi, Krishnendu Chakrabarty by Series: Integrated microsystems series
Material type: Text Text; Format: print ; Literary form: Not fiction ; Audience: General;
Language: English
Publication details: Boston : Artech house, c2010
Availability: Items available for loan: National Library of India (1)Call number: E 621.381548 B 148.

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3.
Integrated interconnect technologies for 3D nanoelectric systems / eds. Mohammad S. Bakir, James D. Meindl by Series: Integrated microsystems series
Material type: Text Text; Literary form: Not fiction ; Audience: General;
Language: English
Publication details: Boston: Artech house , 2009
Availability: Items available for loan: National Library of India (1)Call number: E/O 621.381 In 8.

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4.
Hybrid CMOS single-electron-transistor device and circuit design / Santanu Mahapatra, Adrian Mihai Ionescu by Series: Artech House integrated microsystems series
Material type: Text Text; Format: print ; Literary form: Not fiction ; Audience: General;
Language: English
Publication details: Boston, Mass. : Artech house, c2006
Availability: Items available for loan: National Library of India (1)Call number: S.T. 621.39732 M 277.

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