X-ray diffractometre for the determination of residual stresses/ A. K. Singh , C. Balasingh and N. Narayana Iyer

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Material type: Text

TextLanguage: English Series: NAL Technical note TN-34Publication details: Bangalore : National Aeronautical Laboratory , 1971Description: 11 p. ; 28 cmSubject(s):

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Holdings
Item type	Current library	Collection	Call number	Materials specified	Status	Date due	Barcode	Item holds
Books	National Library of India Annexe Reading Room & Stack Division	Government Publications	GP 629.13072 In2tnno.34 (Browse shelf(Opens below))		Available

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