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	1.	No cover image available Comprehensive test patterns and approach for characterizing SOS technology : semiconductor measurement technology / by W. E. Ham by Ham, W. E Series: NBS technical note ; 400-56 Material type: Text; Format: print ; Literary form: Not fiction Language: English Publication details: Washington, D. C. : U.S. Government Printing Office, 1979 Availability: Items available for loan: National Library of India (1)Call number: U.S 621.3815 H 17. Place hold Request article Save to lists
	2.	No cover image available Comprehensive test patterns and approach for characterizing SOS technology : semiconductor measurement technology / by W. E. Ham by Ham, W. E Series: NBS technical note ; 400-56 Material type: Text; Format: print ; Literary form: Not fiction Language: English Publication details: Washington, D. C. : U.S. Government Printing Office, 1979 Availability: Items available for loan: National Library of India (1)Call number: U.S 621.3815 H 17. Place hold Request article Save to lists
	3.	No cover image available Comprehensive test patterns and approach for characterizing SOS technology : semiconductor measurement technology / by W. E. Ham by Ham, W. E Series: NBS technical note ; 400-56 Material type: Text; Format: print ; Literary form: Not fiction Language: English Publication details: Washington, D. C. : United States Government Printing Office, 1979 Availability: Items available for loan: National Library of India (1)Call number: U.S 621.3815 H 17. Place hold Request article Save to lists

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