Microelectronic test pattern NBS-3 for evaluating the resistivity-dopart density relationship of silicon / Martin G. Buchler

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Material type: Text

TextLanguage: English Publication details: Washington, D. C. : United States Government Printing Office, 1976Description: vi, 49 p. ; 26 cmSubject(s):

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Holdings
Item type	Current library	Collection	Call number	Materials specified	Status	Date due	Barcode	Item holds
Books	National Library of India	US	U.S 621.3815 B 853 (Browse shelf(Opens below))		Available		FOD000005568ENG

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At the head of the title : Semiconductor measurment technology

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