Pattern in organization analysis: a critical examination/ Sherman Krupp
Material type:
TextLanguage: English Publication details: New York: Holt Rinchart and Winston, c1964Description: ix, 201 p.; 22 cmSubject(s): DDC classification: - 658.01
| Item type | Current library | Collection | Call number | Materials specified | Status | Date due | Barcode | Item holds | |
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National Library of India New English - Main Stack Division | New English | E 658.01 K 944 (Browse shelf(Opens below)) | Available | PUR000374432ENG |
Total holds: 0
Includes index
References: p. 187-194
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