Scanning electron microscopy and x-ray microanalysis/ Joseph I. Goldstein ... [et al.]
Material type:
TextPublication details: N.Y. : Kluwer Academic, 2003.Edition: 3rd edDescription: xix, 689p.,[3] leaves of col. plates : ill.(some col.); 25cm. 1 CD romISBN: - 0306472929
- 502.825 22
| Item type | Current library | Collection | Call number | Materials specified | Status | Date due | Barcode | Item holds | |
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National Library of India New English Oversized - Main Stack Division | New English Oversized | E/O 502.825 Sca 63 (Browse shelf(Opens below)) | Available |
Total holds: 0
Includes bibliographical references and index.
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