Scanning probe microscopy : electrical and electromechanical phenomena at the nanoscale/ eds. Sergei Kalinin, Alexei Gruverman

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Material type: Text

TextLanguage: English Publication details: new York : Springer, c2007Description: 2v. : ill. (some col.), ports.; 25 cmISBN:

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Contents:

v.1. xx, 538 p. - v.2. xx, 980 p.

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Holdings
Item type	Current library	Collection	Call number	Materials specified	Status	Date due	Barcode	Item holds
Books	National Library of India New English Oversized - Main Stack Division	New English Oversized	E/O 502.825 Sc 61 (Browse shelf(Opens below))		Available

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Includes bibliographical references and index

v.1. xx, 538 p. - v.2. xx, 980 p.

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