Scanning probe microscopy : atomic scale engineering by forces and currents/ A. Foster, W. Hofer

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Material type: Text

TextLanguage: English Series: Nanoscience and technologyPublication details: New York : Springer, c 2006Description: xiv, 281 p. : ill.; 25 cmISBN:

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Holdings
Item type	Current library	Collection	Call number	Materials specified	Status	Date due	Barcode	Item holds
Books	National Library of India New English Oversized - Main Stack Division	New English Oversized	E/O 502.82 F 811 (Browse shelf(Opens below))		Available		557201

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Includes bibliographical references and index

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