World class reliability : using multiple environment overstress tests to make it happen/ Keki R. Bhote and Adi K. Bhote

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Material type: Text

TextLanguage: English Publication details: New York : Amacom, c2004Description: xix, 218 p. : ill.; 24 cmISBN:

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Holdings
Item type	Current library	Collection	Call number	Materials specified	Status	Date due	Barcode	Item holds
Books	National Library of India New English - Main Stack Division	New English	E 620.00452 B 469 (Browse shelf(Opens below))		Available		PUR000551149ENG

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Includes index

References : p.209-210

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