CTL for test information of digital ICs/ Rohit Kapur

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Material type: Text

TextLanguage: English Publication details: Boston : Kluwer Academic Pub., 2003Description: xi, 173 p. : ill.; 24 cmISBN:

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Holdings
Item type	Current library	Collection	Call number	Materials specified	Status	Date due	Barcode	Item holds
Books	National Library of India New English - Main Stack Division	New English	E 621.3815 K 141 (Browse shelf(Opens below))		Available		PUR000546884ENG

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