Scanning probe microscopy : electrical and electromechanical phenomena at the nanoscale / edited by Sergei Kalinin [and] Alexei Gruverman

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Material type: Text

TextLanguage: English Publication details: New York : Springer, 2007Description: 2 v., [8] p. of plates : ill. (some col.) ; 25 cmISBN:

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Holdings
Item type	Current library	Collection	Call number	Materials specified	Status	Date due	Barcode	Item holds
Books	National Library of India New English Oversized - Main Stack Division	New English Oversized	E/O 502.825 Sca 63 (Browse shelf(Opens below))		Available		PUR000557680ENG
Books	National Library of India New English Oversized - Main Stack Division	New English Oversized	E/O 502.825 Sca 63 (Browse shelf(Opens below))		Available		PUR000557681ENG

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