Scanning probe microscopy : atomic scale engineering by forces and currents / A. Foster [and] W. Hofer

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Material type: Text

TextLanguage: English Series: Nanoscience and technologyPublication details: New York : Springer Science and Business Media, c2006Description: xiv, 281 p. : ill. ; 25 cmISBN:

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Holdings
Item type	Current library	Collection	Call number	Materials specified	Status	Date due	Barcode	Item holds
Books	National Library of India New English Oversized - Main Stack Division	New English Oversized	E/O 502.82 F 811 (Browse shelf(Opens below))		Available		PUR000557201ENG

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