Scanning electron microscopy and x-ray microanalysis / Joseph I. Goldstein ... [et al.]

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Material type: Text

TextLanguage: English Publication details: New York : Kluwer Academic/Plenum Publishers, c2003Edition: 3rd edDescription: xix, 689 p. : ill. (some col.) ; 26 cmISBN:

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Holdings
Item type	Current library	Collection	Call number	Materials specified	Status	Date due	Barcode	Item holds
Books	National Library of India New English Oversized - Main Stack Division	New English Oversized	E/O 502.825 Sca 63 (Browse shelf(Opens below))		Available		PUR000546963ENG

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Includes bibliographical references and index

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