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	1.	Scanning electron microscopy and x-ray microanalysis / Joseph I. Goldstein ... [et al.] by Goldstein, Joseph I, 1939- [jt. aut] Edition: 3rd ed. Material type: Text; Format: print ; Literary form: Not fiction Language: English Publication details: New York : Kluwer Academic/Plenum Publishers, c2003 Availability: Items available for loan: National Library of India (1)Call number: E/O 502.825 Sca 63. Place hold Request article Save to lists
	2.	Principles and techniques of scanning electron microscopy : biological applications / edited by M. A. Hayat by Hayat, M. A [edt] Material type: Text; Format: print ; Literary form: Not fiction Language: English Publication details: New York : Van Nostrand Reinhold Co., 1974- Availability: Items available for loan: National Library of India (1)Call number: E 578.15 H 323. Place hold Request article Save to lists
	3.	Scanning microscopy for nanotechnology : techniques and applications / edited by Weilie Zhou and Zhong Lin Wang by Zhou, Weili [edt] Wang, Zhong Lin [edt] Material type: Text; Format: print ; Literary form: Not fiction Language: English Publication details: New York : Springer, 2007 Availability: Items available for loan: National Library of India (1)Call number: E/O 681.413 Sca 63. Place hold Request article Save to lists
	4.	Scanning microscopy for nanotechnology : techniques and applications/ edited by Weilie Zhou, Zhong Lin Wang by Zhou, Weilie [edt] Wang, Zhong Lin [edt] Material type: Text; Format: print ; Literary form: Not fiction ; Audience: Adult; Language: English Publication details: New York : Springer, c2007 Availability: Items available for loan: National Library of India (1)Call number: E/O 681.413 Sca 63. Place hold Request article Save to lists
	5.	Scanning electron microscopy and x-ray microanalysis/ Joseph I. Goldstein ... [et al.] by Goldstein, Joseph I [jt. aut.] Newbury, Dale E [jt. aut.] Edition: 3rd ed. Material type: Text; Format: print ; Literary form: Not fiction Publication details: N.Y. : Kluwer Academic, 2003 Availability: Items available for loan: National Library of India (1)Call number: E/O 502.825 Sca 63. Place hold Request article Save to lists
	6.	No cover image available Sem measurement of stretched zone width (szw) for determination of initiation fracture toughness in ductile materials/ by D. N. Shah and S. Chatterjee and P. K. Singh by Shah, D. N Chatterjee, S [jt.aut] Singh, P. K [jt.aut] India. Department of Atomic Energy. Bhabha Atomic Research Centre (Mumbai) [pbl.] India. Department of Atomic Energy. Atomic Energy Commission Series: BARC external ; no. BARC/2005/E/017 Material type: Text; Format: print ; Literary form: Not fiction Language: English Publication details: Mumbai : Bhabha Atomic Research Centre, 2005 Availability: Items available for loan: National Library of India (2)Call number: GP 539.7 B 469 No.2005/E/017, ... Place hold Request article Save to lists

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