Random testing of digital circuits: theory and applications/ Rene David

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Material type: Text

TextLanguage: English Publication details: New York: Marcel Dekker, c1998Description: xix, 476 p.; 23 cmISBN:

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Holdings
Item type	Current library	Collection	Call number	Materials specified	Status	Date due	Barcode	Item holds
Books	National Library of India New English - Main Stack Division	New English	E 621.3815 D 28 (Browse shelf(Opens below))		Available		PUR000537007ENG

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Includes index

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