Pattern classification : a unified view of statistical and neural approaches / Jurgen Schurmann

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Material type: Text

TextLanguage: English Publication details: New York : John Wiley, c1996Description: xvii, 371 p. ; 25 cmISBN:

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Holdings
Item type	Current library	Collection	Call number	Materials specified	Status	Date due	Barcode	Item holds
Books	National Library of India New English - Main Stack Division	New English	E 006.4 Sch 86 (Browse shelf(Opens below))		Available		PUR000528667ENG

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Includes bibliographical references and index

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