Statistical Analysis of Reliability and Life-Testing Models: theory and methods/ Lee J. Bain and Max Engelhardt

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Series: Statistics: Textbooks and monographsPublication details: Taylor & Francis; 2020 Boca Raton:Edition: 2nd edDescription: vii, 496p.; 24 cmISBN:

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Holdings
Item type	Current library	Collection	Call number	Materials specified	Status	Date due	Barcode	Item holds
Books	National Library of India New English - Main Stack Division	New English	R.R. 620.00452 B 16 sta (Browse shelf(Opens below))	HB	Available		PUR000579476ENG

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Includes bibliographical references and index

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