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1.
Scanning probe microscopy and spectroscopy : methods and applications / Roland Wiesendanger by
Material type: Text Text; Format: print ; Literary form: Not fiction
Language: English
Publication details: Cambridge : The University Press, 1994
Availability: Items available for loan: National Library of India (1)Call number: E502.82 W637.

2.
Scanning probe microscopy : electrical and electromechanical phenomena at the nanoscale / edited by Sergei Kalinin [and] Alexei Gruverman by
Material type: Text Text; Format: print ; Literary form: Not fiction
Language: English
Publication details: New York : Springer, 2007
Other title:
  • Electrical and electromechanical phenomena at the nanoscale
Availability: Items available for loan: National Library of India (2)Call number: E/O 502.825 Sca 63, ...

3.
Scanning probe microscopy : atomic scale engineering by forces and currents / A. Foster [and] W. Hofer by Series: Nanoscience and technology
Material type: Text Text; Format: print ; Literary form: Not fiction
Language: English
Publication details: New York : Springer Science and Business Media, c2006
Availability: Items available for loan: National Library of India (1)Call number: E/O 502.82 F 811.

4.
Atomic force microscopy, scanning nearfield optical microscopy and nanoscratching : application to rough and natural surfaces/ G. Kaupp by Series: NanoScience technology
Material type: Text Text; Format: print ; Literary form: Not fiction ; Audience: Adult;
Language: English
Publication details: Berlin : Springer, c2006
Availability: Items available for loan: National Library of India (1)Call number: E/O 539.7 K 166.

5.
Scanning probe microscopy : atomic scale engineering by forces and currents/ A. Foster, W. Hofer by Series: Nanoscience and technology
Material type: Text Text; Format: print ; Literary form: Not fiction ; Audience: Adult;
Language: English
Publication details: New York : Springer, c 2006
Availability: Items available for loan: National Library of India (1)Call number: E/O 502.82 F 811.

6.
Scanning probe microscopy : electrical and electromechanical phenomena at the nanoscale/ eds. Sergei Kalinin, Alexei Gruverman by
Material type: Text Text; Format: print ; Literary form: Not fiction ; Audience: Adult;
Language: English
Publication details: new York : Springer, c2007
Availability: Items available for loan: National Library of India (1)Call number: E/O 502.825 Sc 61.

7.
Applied scanning probe methods XIII : Biomimetics and industrial applications/ Bharat Bhushan, Harald Fuchs by Series: Nanoscience and technology
Material type: Text Text; Format: print ; Literary form: Not fiction ; Audience: Adult;
Language: English
Publication details: Berlin : Springer, 2009
Availability: Items available for loan: National Library of India (1)Call number: E 502.82 Ap 58 b.

8.
Applied scanning probe methods / edited by Bharat Bhushan [and] Harald Fuchs by Series: Nanoscience and technology
Material type: Text Text; Format: print ; Literary form: Not fiction
Language: English
Publication details: Heidelberg : Springer, 2006-
Availability: Items available for loan: National Library of India (4)Call number: E/O 502.82 Ap 58, ...

9.
Applied scanning probe methods techniques/ eds. Bharat Bhushan, Harald Fuchs by Series: Nanoscience and technology
Material type: Text Text; Format: print ; Literary form: Not fiction ; Audience: Adult;
Language: English
Publication details: Berlin : Springer, 2006 -
Availability: Items available for loan: National Library of India (1)Call number: E/O 502.82 Ap 58.

                                                                           
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