Ellipsometry in the measurement of surfaces and thin films : symposium proceedings Washington 1963 / edited by E. Passaglia, R. R. Stromberg and J. Kruger

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TextLanguage: English Publication details: Washington, D. C. : U.S. National Bureau of Standards, 1964Description: vi, 359 p. : ill. ; 24 cmSubject(s):

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Holdings
Item type	Current library	Collection	Call number	Materials specified	Status	Date due	Barcode	Item holds
Books	National Library of India	US	U.S 535.5 Sy 68 (Browse shelf(Opens below))		Available		FOD000030791ENG

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Edited by E. Passaglia, R.R. Stromberyand J. Kruger

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