New technology challenges metrology / Judson C. French
Material type:
TextLanguage: English Series: NBS special publication ; 611Publication details: Washington, D.C. : U.S. Dept. of Commerce, National Bureau of Standards, 1981Description: 87 p. : ill. ; 28 cmSubject(s): DDC classification: - 389.1
| Item type | Current library | Collection | Call number | Materials specified | Status | Date due | Barcode | Item holds | |
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National Library of India | US | U.S 389.1 F 888 (Browse shelf(Opens below)) | Available |
Total holds: 0
"Center for Electronics and Electrical Engineering, National Engineering Laboratory, National Bureau of Standards."
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