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	1.	No cover image available Semiconductor measurement technology : reliability technology for cardiac pacemakers III : a workshop report/ edited by Harry A. Schafft by Schafft, Harry A [edt] United States. Department of Commerce Series: NBS special publication ; 400-50 Material type: Text; Format: print ; Literary form: Not fiction Language: English Publication details: Washington, D.C. : U.S. Govt. Printing Office, 1979 Availability: Items available for loan: National Library of India (1)Call number: US 621.3815. Place hold Save to lists
	2.	No cover image available ARPA/NBS workshop III : test patterns for integrated circuits / edited by Harry A. Schafft by Schafft, Harry A Series: Semiconductor measurement technology \| NBS special publication ; 400-15 Material type: Text; Format: print ; Literary form: Not fiction Language: English Publication details: Washington : U.S. Dept. of Commerce, National Bureau of Standards, 1976 Availability: Items available for loan: National Library of India (1)Call number: U.S 621.3815 Sch 14. Place hold Request article Save to lists
	3.	No cover image available ARPA/NBS workshop III : test patterns for integrated circuits / edited by Harry A. Schafft by Schafft, Harry A Series: Semiconductor measurement technology \| NBS special publication ; 400-15 Material type: Text; Format: print ; Literary form: Not fiction Language: English Publication details: Washington : U.S. Dept. of Commerce, National Bureau of Standards, 1976 Availability: Items available for loan: National Library of India (1)Call number: U.S 621.3815 Sch 14. Place hold Request article Save to lists
	4.	No cover image available ARPA/NBS Workshop II, hermitivity testing for integrated circuits / Harry A. Schafft by Schafft, Harry A United States. National Bureau of Standards United States. Advanced Research Projects Agency Series: Semiconductor measurement technology \| NBS special publication ; 400-69. Material type: Text; Format: print ; Literary form: Not fiction Language: English Publication details: Washington : U.S. Dept. of Commerce, National Bureau of Standards, 1974 Availability: Items available for loan: National Library of India (1)Call number: U.S 621.3815 Sch 14. Place hold Request article Save to lists
	5.	No cover image available ARPA/NBS Workshop II, hermitivity testing for integrated circuits / Harry A. Schafft by Schafft, Harry A United States. National Bureau of Standards United States. Advanced Research Projects Agency Series: Semiconductor measurement technology \| NBS special publication ; 400-69. Material type: Text; Format: print ; Literary form: Not fiction Language: English Publication details: Washington : U.S. Dept. of Commerce, National Bureau of Standards, 1974 Availability: Items available for loan: National Library of India (1)Call number: U.S 621.3815 Sch 14. Place hold Request article Save to lists
	6.	No cover image available NBS/DOE Workshop, Stability of (Thin Film) Solar Cells and Materials / edited by David E. Sawyer and Harry A. Schafft, Electron Devices Division, Center for Electronics and Electrical Engineering, National Engineering Laboratory, National Bureau of Standards ; sponsored by Advanced Materials R&D Branch, Division of Distribution Solar Technology, Department of Energy by Workshop on the Stability of (Thin Film) Solar Cells and Materials (1978 Gaithersburg, Md.) Sawyer, David E [edt] Schafft, Harry A [edt] Center for Electronics and Electrical Engineering (U.S.). Electron Devices Division United States. Department of Energy. Advanced Materials R&D Branch Series: Semiconductor measurement technology \| NBS special publication ; 400-58. Material type: Text; Format: print ; Literary form: Not fiction Language: English Publication details: Washington, D. C. : U.S. Dept. of Commerce, National Bureau of Standards : for sale by the Supt. of Docs., U.S. Govt. Print. Off., 1979 Availability: Items available for loan: National Library of India (1)Call number: U.S 602.18 W 892. Place hold Request article Save to lists
	7.	No cover image available NBS/DOE Workshop, Stability of (Thin Film) Solar Cells and Materials / edited by David E. Sawyer and Harry A. Schafft, Electron Devices Division, Center for Electronics and Electrical Engineering, National Engineering Laboratory, National Bureau of Standards ; sponsored by Advanced Materials R&D Branch, Division of Distribution Solar Technology, Department of Energy by Workshop on the Stability of (Thin Film) Solar Cells and Materials (1978 Gaithersburg, Md.) Sawyer, David E [edt] Schafft, Harry A [edt] Center for Electronics and Electrical Engineering (U.S.). Electron Devices Division United States. Department of Energy. Advanced Materials R&D Branch Series: Semiconductor measurement technology \| NBS special publication ; 400-58. Material type: Text; Format: print ; Literary form: Not fiction Language: English Publication details: Washington, D. C. : U.S. Dept. of Commerce, National Bureau of Standards : for sale by the Supt. of Docs., U.S. Govt. Print. Off., 1979 Availability: Items available for loan: National Library of India (1)Call number: U.S 602.18 W 892. Place hold Request article Save to lists

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