TY  - BOOK
AU  - Passaglia,Elio
AU  - Stromberg,Robert R.
AU  - Kruger,Jerome
ED  - Symposium on the Ellipsometer and its Use in the Measurement of Surfaces and Thin Films
ED  - United States.
TI  - Ellipsometry in the measurement of surfaces and thin films: symposium proceedings Washington 1963 
U1  -  535.5 
PY  - 1964///
CY  - Washington, D. C.
PB  - U.S. National Bureau of Standards
KW  - Polarization (Light)
KW  - Surfaces (Technology)
KW  - Thin films
N1  - Edited by E. Passaglia, R.R. Stromberyand J. Kruger
ER  -