Ellipsometry in the measurement of surfaces and thin films : symposium proceedings Washington 1963 - Symposium on the Ellipsometer and its Use in the Measurement of Surfaces and Thin Films Washington, D.C. 1963; Passaglia, Elio; Stromberg, Robert R.; Kruger, Jerome; United States. Department of Commerce (Washington, D. C. : U.S. National Bureau of Standards, 1964)
Edited by E. Passaglia, R.R. Stromberyand J. Kruger
Keywords: Polarization (Light); Surfaces (Technology); Thin films