Ellipsometry in the measurement of surfaces and thin films :  symposium proceedings Washington 1963 / 
edited by E. Passaglia, R. R. Stromberg and J. Kruger 
 - Washington, D. C. :  U.S. National Bureau of Standards,  1964 
 - vi, 359 p. :  ill. ;  24 cm. 
<br/><br/> Edited by E. Passaglia, R.R. Stromberyand J. Kruger 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Polarization (Light)<br/>Surfaces (Technology)<br/>Thin films
<br/><br/><label>Dewey Class. No.: </label>535.5