TY  - BOOK
AU  - French,Judson C.
ED  - United States.
ED  - Center for Electronics and Electrical Engineering (U.S.)
ED  - Interamerican Metrology Conference
TI  - New technology challenges metrology
U1  -  389.1 
PY  - 1981///
CY  - Washington, D.C.
PB  - U.S. Dept. of Commerce, National Bureau of Standards
KW  - Measurement
KW  - Technological innovations
N1  - "Center for Electronics and Electrical Engineering, National Engineering Laboratory, National Bureau of Standards."
ER  -