New technology challenges metrology - French, Judson C.; United States. National Bureau of Standards; Center for Electronics and Electrical Engineering (U.S.); Interamerican Metrology Conference (1979 : Buenos Aires, Argentina) (Washington, D.C. : U.S. Dept. of Commerce, National Bureau of Standards, 1981)
"Center for Electronics and Electrical Engineering, National Engineering Laboratory, National Bureau of Standards."
Keywords: Measurement -- Technological innovations