French, Judson C. <br/><br/>
New technology challenges metrology / 
Judson C. French 
 - Washington, D.C. :  U.S. Dept. of Commerce, National Bureau of Standards,  1981 
 - 87 p. :  ill. ;  28 cm. 
 - NBS special publication ;  611 .
<br/><br/> "Center for Electronics and Electrical Engineering, National Engineering Laboratory, National Bureau of Standards." 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Measurement--Technological innovations
<br/><br/><label>Dewey Class. No.: </label>389.1