Bhattacharyya, D. <br/><br/>
Characterisation of thin films by phase modulated spectroscopic ellipsometry / 
D. Bhattacharyya and N. C. Das 
 - Mumbai :  Bhabha Atomic Research Center,  1998 
 - 33 p. :  ill. ;  29 cm. 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Thin film devices--India
<br/><br/><label>Dewey Class. No.: </label>539.7