Determination of thin film thickness by activation analysis - Vermani, S. K.; Muraka, S. P.; Agarwala, R. P.; India. Department of Atomic Energy. Atomic Energy Commission; Atomic Energy Establishment Trombay (Bombay : Atomic Energy Establishment Trombay, 1966)
Later name of the Publisher: Bhabha Atomic Research Centre
Keywords: Bhabha Atomic Research Centre (Bombay); Physics, analysis