Vermani, S. K. <br/><br/>
Determination of thin film thickness by activation analysis / 
S. K. Kermani, S. P. Vermani, S. P. Muraka and R. P. Agarwala 
 - Bombay :  Atomic Energy Establishment Trombay ,  1966 
 - 5 p. ;  28 cm. 
<br/><br/> Later name of the Publisher: Bhabha Atomic Research Centre 
<br/><br/><label>Subjects--Corporate Names: </label><br/>Bhabha Atomic Research Centre (Bombay)
<br/><br/><label>Subjects--Topical Terms: </label><br/>Physics, analysis
<br/><br/><label>Dewey Class. No.: </label>539.7