Advances in x-ray analysis : proceedings of the ninth annual Conference on Application of X-ray Analysis - Conference on Application of X-ray Analysis 1960, August 10-12); Mueller, William M.; Denver Research Institute (New York : Plenum Press, 1960)
Vol. 1-39 includes 6th-44th proceedings of the annual conference
Library has vol.4
Keywords: X-rays -- Industrial applications -- Congresses; Radiometry -- Congresses; Kristallografie; Rontgenstraling