TY  - BOOK
AU  - Srinivasan,C.
AU  - Balasingh,C.
AU  - Singh,A.K.
ED  - National Aeronautical Laboratory, Bangalore,
TI  - Mesurement of Thicknessof thin films bythe X-ray diffraction method
U1  - 629.13072 
PY  - 1979///
CY  - Bangalore
PB  - National Aeronautical Laboratory
ER  -