Srinivasan, C. <br/><br/>
Mesurement of Thicknessof thin films bythe X-ray diffraction method  / 
C. Srinivasan, C. Balasingh and A. K. Singh ; published by National Aeronautical Laboratory, Bangalore 
 - Bangalore :  National Aeronautical Laboratory,  1979 
 - 28 p. ;  28 cm. 
<br/><br/><label>Dewey Class. No.: </label>629.13072