TY  - BOOK
AU  - Bnehler,Martin G.
ED  - United States.
TI  - Microeletronic test patterns: an over view 
U1  -  621.3815 
PY  - 1974///
CY  - Washington, D.C.
PB  - United States Government Printing Office
KW  - Microelectronics
KW  - Electronic circuits
KW  - Electronics
N1  - Semiconductor measurement technology
ER  -