Bnehler, Martin G. <br/><br/>
Microeletronic test patterns :  an over view / 
Martin G. Bnehler 
 - Washington, D.C. :  United States Government Printing Office,  1974 
 - 19 p. ;  26 cm. 
<br/><br/> Semiconductor measurement technology 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Microelectronics<br/>Electronic circuits<br/>Electronics
<br/><br/><label>Dewey Class. No.: </label>621.3815