Houck, Max Fundamentals of forensic science Max Houck, Jay Siegel - Amsterdam, The Netherlands Elsevier c2006 - xv, 672 p. ill.(chiefly col.), facsim., map 26 cm. Includes bibliographical references and index ISBN: 0123567629 $ 79.9 Subjects--Topical Terms: Forensic sciencesCriminal investigation Dewey Class. No.: 363.25