Kempanna,C. <br/><br/>
Variability pattern and its impact on the structure of yield in ragi / 
C. Kempanna 
 - Bangalore :  University of Agriculture Sciences,  1975 
 - 105 p. ;  24 cm. 
 - U.A.S.Tech,Series .
<br/><br/><label>Subjects--Topical Terms: </label><br/>Corn
<br/><br/><label>Dewey Class. No.: </label>633.17