Scanning electron microscopy and x-ray microanalysis/ 
Joseph I. Goldstein ... [et al.] 
 - 3rd ed. 
 - N.Y. :  Kluwer Academic,  2003. 
 - xix, 689p.,[3] leaves of col. plates :  ill.(some col.);  25cm.  1 CD rom. 
<br/><br/>Includes bibliographical references and index. 
<br/><br/><label>ISBN: </label>0306472929  £76.50 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Scanning electron microscopy<br/>X-ray microanalysis<br/>Electron microscopy<br/>Image analysis
<br/><br/><label>Dewey Class. No.: </label>502.825