Scanning probe microscopy :  electrical and electromechanical phenomena at the nanoscale/ 
eds. Sergei Kalinin, Alexei Gruverman 
 - new York :  Springer,  c2007 
 - 2v. :  ill. (some col.), ports.;  25 cm. 
<br/><br/>Includes bibliographical references and index 
<br/><br/>v.1. xx, 538 p. - v.2. xx, 980 p. 
<br/><br/><label>ISBN: </label>0387286683 (v.1)  Euro269.00 set of 2 vols. 0387286679 (v.2)  Euro269.00 set of 2 vols. 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Nanoelectronics<br/>Scanning probe microscopy
<br/><br/><label>Dewey Class. No.: </label>502.825