Foster, A. <br/><br/>
Scanning probe microscopy :  atomic scale engineering by forces and currents/ 
A. Foster, W. Hofer 
 - New York :  Springer,  c 2006 
 - xiv, 281 p. :  ill.;  25 cm. 
 - Nanoscience and technology .
<br/><br/>Includes bibliographical references and index 
<br/><br/><label>ISBN: </label>0387400907  Euro 119.95 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Scanning probe microscopy
<br/><br/><label>Dewey Class. No.: </label>502.82