Bhote, Keki R. <br/><br/>
World class reliability :  using multiple environment overstress tests to make it happen/ 
Keki R. Bhote and Adi K. Bhote 
 - New York :  Amacom,  c2004 
 - xix, 218 p. :  ill.;  24 cm. 
<br/><br/> Includes index 
<br/><br/>References : p.209-210 
<br/><br/><label>ISBN: </label>0814407927  $ 39.95 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Reliability (Engineering)
<br/><br/><label>Dewey Class. No.: </label>620.00452