TY  - BOOK
AU  - Kapur,Rohit
TI  - CTL for test information of digital ICs
SN  - 1402072937
U1  - 621.3815 22
PY  - 2003///
CY  - Boston
PB  - Kluwer Academic Pub.
KW  - Digital integrated circuits
KW  - Design and construction
KW  - Digital electronics
ER  -