Kapur, Rohit <br/><br/>
CTL for test information of digital ICs/ 
Rohit Kapur 
 - Boston :  Kluwer Academic Pub.,  2003 
 - xi, 173 p. :  ill.;  24 cm. 
<br/><br/><label>ISBN: </label>1402072937  Eu 164.00 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Digital integrated circuits--Design and construction<br/>Digital electronics
<br/><br/><label>Dewey Class. No.: </label>621.3815