Krupp, Sherman <br/><br/>
Pattern in organization analysis:  a critical examination/ 
Sherman Krupp 
 - New York:  Holt Rinchart and Winston,  c1964 
 - ix, 201 p.;  22 cm. 
<br/><br/> Includes index 
<br/><br/>References: p. 187-194 
<br/><br/><label>ISBN: </label> $. 3.25 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Organization<br/>Organiztional behaviour<br/>Organizational change<br/>Industrial organization<br/>Industrial management
<br/><br/><label>Dewey Class. No.: </label>658.01