Scanning probe microscopy :  electrical and electromechanical phenomena at the nanoscale / 
 Electrical and electromechanical phenomena at the nanoscale 
edited by Sergei Kalinin [and] Alexei Gruverman 
 - New York :  Springer,  2007 
 - 2 v., [8] p. of plates :  ill. (some col.) ;  25 cm. 
<br/><br/> Includes index 
<br/><br/><label>ISBN: </label>0387286675 :  E269.00 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Scanning probe microscopy
<br/><br/><label>Dewey Class. No.: </label>502.825