Foster, A.  1975- <br/><br/>
Scanning probe microscopy :  atomic scale engineering by forces and currents / 
A. Foster [and] W. Hofer 
 - New York :  Springer Science and Business Media,  c2006 
 - xiv, 281 p. :  ill. ;  25 cm. 
 - Nanoscience and technology .
<br/><br/> Includes index 
<br/><br/><label>ISBN: </label>0387400907 :  USD 119.95 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Scanning probe microscopy
<br/><br/><label>Dewey Class. No.: </label>502.82