Scanning electron microscopy and x-ray microanalysis / 
Joseph I. Goldstein ... [et al.] 
 - 3rd ed. 
 - New York :  Kluwer Academic/Plenum Publishers,  c2003 
 - xix, 689 p. :  ill. (some col.) ;  26 cm. 
<br/><br/>Includes bibliographical references and index 
<br/><br/><label>ISBN: </label>0306472929 :  PND 76.50 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Scanning electron microscopy<br/>X-ray microanalysis
<br/><br/><label>Dewey Class. No.: </label>502.825