Bain, Lee J. <br/><br/>
Statistical Analysis of Reliability and Life-Testing Models:  theory and methods/ 
Lee J. Bain and Max Engelhardt 
 - 2nd ed.  
 - Boca Raton:  Taylor & Francis;  2020 
 - vii, 496p.;  24 cm 
 - Statistics: Textbooks and monographs:  .
<br/><br/>Includes bibliographical references and index 
<br/><br/><label>ISBN: </label>9780367851347  £ 1150.00 (Set of 10 vols) 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Reliability ( Engineering)--Statistical methods<br/>Accelarated life testing<br/>Distribution (Probability theory)<br/>Mathematical statistics
<br/><br/><label>Dewey Class. No.: </label>R.R. 620.00452  / B 16 sta