TY  - BOOK
AU  - David,Rene
TI  - Random testing of digital circuits: theory and applications
SN  - 0824701820
U1  - 621.3815 
PY  - 1998///
CY  - New York
PB  - Marcel Dekker
KW  - Digital integrated circuits
KW  - Digital electronics
KW  - Integrated circuits
N1  - Includes index
ER  -