David, Rene <br/><br/>
Random testing of digital circuits:  theory and applications/ 
Rene David 
 - New York:  Marcel Dekker,  c1998 
 - xix, 476 p.;  23 cm. 
<br/><br/> Includes index 
<br/><br/><label>ISBN: </label>0824701820  $ 185.00 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Digital integrated circuits<br/>Digital electronics<br/>Integrated circuits
<br/><br/><label>Dewey Class. No.: </label>621.3815